Telegraph noise mechanism and LLG noise model

Author

Chen, Lujun ; De-Castro, Juan Fernandez ; Giusti, Jim ; Fang, Hao ; Hurben, Michael

Author_Institution

Seagate Technol. Inc., Bloomington, MN, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

3195

Lastpage

3198

Abstract

A preliminary study on random telegraph noise (RTN) is made. RTN is defined as the magnetization states switching by thermal fluctuations. State jumping resulting in baseline shift from the media field could also be RTN-associated multi-states switching. Our analysis shows that the root cause of such magnetization multi-states could be due to: (1) free layer edge states switching caused by a weak PM field; (2) surface and/or interface roughness, especially the lapped air bearing surface (ABS); and (3) random defects in the stack layers. A thermal noise model with Landau-Lifshitz-Gilbert equation (LLG) was developed and was applied to RTN demonstration

Keywords

magnetic recording noise; magnetic switching; magnetisation; thermal noise; LLG model; Landau-Lifshitz-Gilbert equation; PM field; air bearing surface; free layer edge states; interface roughness; magnetic recording; magnetization; multi-states switching; random defects; random telegraph noise; stack layer; surface roughness; thermal fluctuations; thermal noise; Bifurcation; Fluctuations; Magnetic field measurement; Magnetic levitation; Magnetic noise; Magnetic switching; Magnetization; Rough surfaces; Telegraphy; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908735

Filename

908735