DocumentCode
1449613
Title
Optimization of Device Clocking Schemes to Minimize the Effects of Radiation Damage in Charge-Coupled Devices
Author
Hall, David J. ; Gow, Jason ; Murray, Neil J. ; Holland, Andrew D.
Author_Institution
Dept. of Phys. Sci., Open Univ., Milton Keynes, UK
Volume
59
Issue
4
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
1099
Lastpage
1106
Abstract
The European Space Agency Euclid mission aims to answer the question of how the universe originated through the mapping of the dark Universe. One method to investigate this geometry is to measure subtle changes in ellipticity using image sensors such as the charge-coupled device (CCD). However, the radiation environment in space plays a major part in the performance of CCD-based camera systems. When placed in space, a CCD becomes damaged by the radiation environment, and this can lead to a “smearing” of the charge, acting to change the ellipticity, and therefore, one must be able to separate the changes in ellipticity caused by radiation damage from those the mission aims to measure. To this end, the radiation-damage-induced shape changes require an in-depth investigation such that optimized operation can be achieved. A Monte Carlo simulation is being used to predict this impact, backed by experimental data from a detector formerly baselined for the mission. During the experimental study, an investigation was undertaken into the serial readout of the CCD to demonstrate an approach toward performance optimization through a consideration of the trap species involved. A change in the clocking scheme was found to result in a factor of 3 reduction in charge transfer inefficiency.
Keywords
charge-coupled devices; radiation effects; CCD-based camera system; Monte Carlo simulation; charge transfer inefficiency; charge-coupled devices; device clocking schemes; ellipticity; geometry; image sensors; performance optimization; radiation damage; radiation environment; radiation-damage-induced shape; trap species; Charge coupled devices; Charge transfer; Clocks; Electron traps; Monte Carlo methods; Registers; Timing; Charge-coupled device (CCD); charge transfer efficiency (CTE); charge transfer inefficiency (CTI); radiation damage; simulation; trapping;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2185240
Filename
6153056
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