• DocumentCode
    1449634
  • Title

    Monte Carlo study of the influence of collector region velocity overshoot on the high-frequency performance of AlGaAs/GaAs heterojunction bipolar transistors

  • Author

    Rockett, Peter I.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Sheffield Univ., UK
  • Volume
    35
  • Issue
    10
  • fYear
    1988
  • fDate
    10/1/1988 12:00:00 AM
  • Firstpage
    1573
  • Lastpage
    1579
  • Abstract
    Detailed Monte Carlo calculations of electron transport in the base-collector junctions of heterojunction bipolar transistors are reported. In particular, the author focused on velocity overshoot in the collector region and its influence on collector transit time. Very high peak electron velocities (7-9×107 cm/s) were observed over narrow regions just inside the collector (300-500 Å). However, the effects of velocity overshoot on reducing the total collector transit time were found to be marginal and the transit times were not very different from what would be predicted by assuming a constant saturated drift velocity of 107 cm/s throughout the collector depletion layer. The calculations presented here confirm that Y. Yamauchi and T. Ishibashi (1986) greatly overestimate the contribution to transistor performance from velocity overshoot in the collector region
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; 300 to 500 A; AlGaAs-GaAs; III-V semiconductors; Monte Carlo calculations; base-collector junctions; collector region velocity overshoot; collector transit time; constant saturated drift velocity; electron transport; electron velocities; heterojunction bipolar transistors; high-frequency performance; transistor performance; Absorption; Acoustic scattering; Current density; Deformable models; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Monte Carlo methods; Optical scattering; Phonons;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.7355
  • Filename
    7355