DocumentCode :
1449634
Title :
Monte Carlo study of the influence of collector region velocity overshoot on the high-frequency performance of AlGaAs/GaAs heterojunction bipolar transistors
Author :
Rockett, Peter I.
Author_Institution :
Dept. of Electron. & Electr. Eng., Sheffield Univ., UK
Volume :
35
Issue :
10
fYear :
1988
fDate :
10/1/1988 12:00:00 AM
Firstpage :
1573
Lastpage :
1579
Abstract :
Detailed Monte Carlo calculations of electron transport in the base-collector junctions of heterojunction bipolar transistors are reported. In particular, the author focused on velocity overshoot in the collector region and its influence on collector transit time. Very high peak electron velocities (7-9×107 cm/s) were observed over narrow regions just inside the collector (300-500 Å). However, the effects of velocity overshoot on reducing the total collector transit time were found to be marginal and the transit times were not very different from what would be predicted by assuming a constant saturated drift velocity of 107 cm/s throughout the collector depletion layer. The calculations presented here confirm that Y. Yamauchi and T. Ishibashi (1986) greatly overestimate the contribution to transistor performance from velocity overshoot in the collector region
Keywords :
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; 300 to 500 A; AlGaAs-GaAs; III-V semiconductors; Monte Carlo calculations; base-collector junctions; collector region velocity overshoot; collector transit time; constant saturated drift velocity; electron transport; electron velocities; heterojunction bipolar transistors; high-frequency performance; transistor performance; Absorption; Acoustic scattering; Current density; Deformable models; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Monte Carlo methods; Optical scattering; Phonons;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.7355
Filename :
7355
Link To Document :
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