• DocumentCode
    1449675
  • Title

    A third-order Δ-Σ modulator using second-order noise-shaping dynamic element matching

  • Author

    Yasuda, Akira ; Tanimoto, Hiroshi ; Iida, Tetsuya

  • Author_Institution
    Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan
  • Volume
    33
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    1879
  • Lastpage
    1886
  • Abstract
    A multibit Δ-Σ modulator is an attractive way of realizing a high-accuracy, high-speed, and low-power data converter. However, the overall resolution of the modulator is determined by the internal digital-to-analog conversion (DAC) linearity. Methods for high-order noise shaping, noise-shaping dynamic element matching (NSDEM), have been proposed in order to overcome this drawback. However, a real implementation has not been realized until now. This paper presents the actual circuit configuration of a tree-structured NSDEM (TNSDEM) technique, which is applied to a multibit Δ-Σ DAC and analog-to-digital converter (ADC) using a nine-level internal DAC. This is the first report of a Δ-Σ ADC and DAC using the second-order NSDEM method. The test chip of the third-order Δ-Σ ADC realizes a signal bandwidth of 100 kHz and a dynamic range of 79 dB in the ADC and 80 dB in the DAC. The test chip only consumes 9.6 mW in the ADC and 5.2 mW in the DAC with a 2.7 V power supply
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; circuit feedback; delta-sigma modulation; integrated circuit noise; Δ-Σ ADC; 100 kHz; 2.7 V; 5.2 mW; 9.6 mW; digital-to-analog conversion linearity; dynamic element matching; high-speed data converter; internal DAC linearity; low-power data converter; multibit Δ-Σ modulator; nine-level internal DAC; second-order noise-shaping; third-order Δ-Σ modulator; tree-structured NSDEM technique; Analog-digital conversion; Bandwidth; Circuit testing; Delta modulation; Digital modulation; Digital-analog conversion; Dynamic range; Linearity; Noise shaping; Power supplies;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.735527
  • Filename
    735527