DocumentCode
1449695
Title
Giant magnetostriction of TbFe monolayers with improved field-induced sensitivity
Author
Le Gall, H. ; Youssef, J.B. ; Tiercelin, N. ; Pernod, P. ; Preobrazhensky, V. ; Ostorero, J.
Author_Institution
Lab. de Magnetisme de Bretagne, CNRS, Brest, France
Volume
36
Issue
5
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
3223
Lastpage
3225
Abstract
Giant magnetostriction, (GMS), reported until now in thin films using rare earth-transition metal RM2 (R=Tb, Sm, and M=Fe, Co) compounds, presents in most cases an isotropic or quasi-isotropic magnetoelastic (ME) behavior. A large change of the ME coefficient b under the lowest possible external field is required in order to improve the sensitivity of these materials which are interesting for their application in microelectromechanical systems (MEMS). The present paper shows the possibility of improving strongly both the ME coefficient and sensitivity. Optimized ME properties are correlated with the sputtering parameters such as the RF power Prf and the sputtering gas pressure PAr. The magnetostriction increases with Prf up to very large saturation values not observed until now in TbFe films (Δl/l=1300 ppm or bγ,2=50 MPa at 20 kOe) due to a structural change from amorphous at low Prf to crystallized phase at a high Prf as confirmed from XRD. When a bias magnetic field Hd is applied on the film during deposition a strong change is seen in the structural, elastic, magnetic and ME properties, Hd keeps the amorphous phase even at high Prf which induces a reduction of the ME “linewidth” but an increase of the GMS sensitivity
Keywords
ferromagnetic materials; iron alloys; magnetic thin films; magnetoelastic effects; magnetostriction; terbium alloys; TbFe; amorphous phase; bias magnetic field; crystallized phase; external field; field-induced sensitivity; giant magnetostriction; quasi-isotropic magnetoelastic behavior; saturation values; sputtering gas pressure; sputtering parameters; Amorphous magnetic materials; Amorphous materials; Magnetic materials; Magnetostriction; Microelectromechanical systems; Micromechanical devices; Radio frequency; Saturation magnetization; Sputtering; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.908746
Filename
908746
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