• DocumentCode
    1449707
  • Title

    An analog background calibration technique for time-interleaved analog-to-digital converters

  • Author

    Dyer, Kenneth C. ; Fu, Daihong ; Lewis, Stephen H. ; Hurst, Paul J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
  • Volume
    33
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    1912
  • Lastpage
    1919
  • Abstract
    Analog background calibration using adaptive signal processing, an extra channel, and mixed signal integrators matches the offsets and gains of time-interleaved channels in a 10-b 40-Msample/s pipelined analog-to-digital converter. With monolithic background calibration, the peak signal-to-noise-and-distortion ratio is 58 dR, and power dissipation is 650 mW from 5 V. The active area is 47 mm2 in 1 μm CMOS
  • Keywords
    CMOS integrated circuits; adaptive signal processing; analogue-digital conversion; calibration; integrating circuits; 1 micron; 10 bit; 5 V; 650 mW; CMOS technology; adaptive signal processing; analog background calibration technique; analog-to-digital converters; mixed signal integrators; pipelined ADC; time-interleaved ADC; Adaptive signal processing; Adaptive systems; Analog-digital conversion; Calibration; Power dissipation; Sampling methods; Signal processing; Signal sampling; Signal to noise ratio; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.735531
  • Filename
    735531