• DocumentCode
    1449714
  • Title

    A continuously calibrated 12-b, 10-MS/s, 3.3-V A/D converter

  • Author

    Ingino, Joseph M. ; Wooley, Bruce A.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    33
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    1920
  • Lastpage
    1931
  • Abstract
    The continuous calibration of high-linearity, highspeed analog/digital converters (ADCs) can minimize system complexity by allowing a single converter to maintain its accuracy over time. This paper introduces a continuous calibration technique for pipelined and successive approximation ADCs that avoids some of the limitations of earlier designs by performing the calibration in the analog domain. The calibration is made transparent to the overall system by employing an extra stage that is calibrated outside of the main converter´s operation and periodically substituted for a stage within the main converter. A 12-b, pipelined ADC employing this architecture has been integrated in a 0.5-μm, single-poly, quadruple-metal, 3.3-V CMOS technology. The measured dynamic performance indicates that at a 10-MHz sampling rate, the circuit achieves a peak signal-to-noise-plus-distortion ratio of 67 dB and a total harmonic distortion of -77 dR for a 4.8-MHz input. The total power dissipated by the prototype is 335 mW, and its active area is 3.71×3.91 mm2
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; pipeline processing; 0.5 micron; 10 MHz; 12 bit; 3.3 V; 335 mW; A/D converter; analog domain calibration; continuous calibration technique; high-linearity convertor; highspeed ADC; pipelined ADC; single-poly quadruple-metal CMOS technology; successive approximation; Analog-digital conversion; CMOS technology; Calibration; Digital signal processing; Error correction; Integrated circuit technology; Signal processing; Signal processing algorithms; Signal sampling; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.735532
  • Filename
    735532