A 300°C dynamic-feedback instrumentation amplifier

Author

de Jong, Paul C. ; Meijer, Gerard C M ; Van Roermund, Arthur H M

Author_Institution

Phys. & Electron. Lab., Netherlands Organ. for Appl. Sci. Res., Den Haag, Netherlands

Volume

33

Issue

12

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

1999

Lastpage

2009

Abstract

A high-temperature instrumentation amplifier that uses dynamic feedback is presented. It realizes dynamic feedback by means of a rotating chain of resistors to compensate for resistor mismatches. An 11× dynamic-feedback instrumentation amplifier has been integrated in a standard junction-isolated 1.6-μm CMOS process and realizes an average gain error below 25 ppm up to 250°C without calibration or trimming. Leakage currents cause additional gain errors at higher temperatures. Nevertheless, even at 300°C, this average gain error is still less than 500 ppm

Keywords

CMOS analogue integrated circuits; feedback amplifiers; high-temperature electronics; instrumentation amplifiers; 1.6 micron; 300 C; CMOS process; dynamic feedback; gain error; high temperature instrumentation amplifier; junction isolation; leakage current; resistor mismatch compensation; rotating resistor chain; Bridge circuits; Calibration; Feedback; Instruments; Leakage current; Ocean temperature; Resistors; Sea measurements; Signal processing; Transducers;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.735541

Filename

735541