• DocumentCode
    1449893
  • Title

    An active charge cancellation system for switched-capacitor sensor interface circuits

  • Author

    Schiffer, Brian R. ; Burstein, Amit ; Kaiser, William J.

  • Author_Institution
    Rockwell Inst. Sci. Center, Thousand Oaks, CA, USA
  • Volume
    33
  • Issue
    12
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    2134
  • Lastpage
    2138
  • Abstract
    Interface circuits determine the performance of microsensors in diverse automotive, medical, and process-control applications. Microsensor systems for acceleration, rotation, pressure, and other signals most typically rely on capacitive displacement measurement in microstructures. Displacement sensitivity requirements are typically 0.1 pm with sensor capacitor values of 100 fF or less. Conventional architectures for capacitive displacement measurement have required bias control with either large value off-chip or large-area integrated resistive circuit components. Switched-capacitor measurement methods may provide a fully integrated solution with compact geometry but have been limited by severe charge injection error signals. The active charge cancellation system (ACCS), reported here, provides the first direct compensation of switched-capacitor charge-injection error at the measurement system input. The ACCS, implemented in a 0.8-μm digital CMOS technology, uses a novel feedback network to directly cancel charge injection and reduce error by over two orders of magnitude without need for component matching
  • Keywords
    CMOS integrated circuits; capacitive sensors; charge injection; circuit feedback; displacement measurement; error compensation; microsensors; switched capacitor networks; 0.8 micron; CMOS technology; active charge cancellation system; capacitive displacement measurement; charge injection error compensation; feedback network; microsensor; switched capacitor sensor interface circuit; Acceleration; Accelerometers; Automotive engineering; CMOS technology; Charge measurement; Current measurement; Displacement measurement; Integrated circuit measurements; Microsensors; Sensor systems;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.735556
  • Filename
    735556