DocumentCode
1449893
Title
An active charge cancellation system for switched-capacitor sensor interface circuits
Author
Schiffer, Brian R. ; Burstein, Amit ; Kaiser, William J.
Author_Institution
Rockwell Inst. Sci. Center, Thousand Oaks, CA, USA
Volume
33
Issue
12
fYear
1998
fDate
12/1/1998 12:00:00 AM
Firstpage
2134
Lastpage
2138
Abstract
Interface circuits determine the performance of microsensors in diverse automotive, medical, and process-control applications. Microsensor systems for acceleration, rotation, pressure, and other signals most typically rely on capacitive displacement measurement in microstructures. Displacement sensitivity requirements are typically 0.1 pm with sensor capacitor values of 100 fF or less. Conventional architectures for capacitive displacement measurement have required bias control with either large value off-chip or large-area integrated resistive circuit components. Switched-capacitor measurement methods may provide a fully integrated solution with compact geometry but have been limited by severe charge injection error signals. The active charge cancellation system (ACCS), reported here, provides the first direct compensation of switched-capacitor charge-injection error at the measurement system input. The ACCS, implemented in a 0.8-μm digital CMOS technology, uses a novel feedback network to directly cancel charge injection and reduce error by over two orders of magnitude without need for component matching
Keywords
CMOS integrated circuits; capacitive sensors; charge injection; circuit feedback; displacement measurement; error compensation; microsensors; switched capacitor networks; 0.8 micron; CMOS technology; active charge cancellation system; capacitive displacement measurement; charge injection error compensation; feedback network; microsensor; switched capacitor sensor interface circuit; Acceleration; Accelerometers; Automotive engineering; CMOS technology; Charge measurement; Current measurement; Displacement measurement; Integrated circuit measurements; Microsensors; Sensor systems;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.735556
Filename
735556
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