Title :
Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge
Author :
Rao, Wenjing ; Yang, Chengmo ; Karri, Ramesh ; Orailoglu, Alex
Abstract :
Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.
Keywords :
electronic engineering computing; low-power electronics; nanoelectronics; power aware computing; reliability; device density; future systems; nanoscale devices; reliability strategies; Nanoelectronics; Nanoscale devices; Reliability; Technological innovation; Nanoscale systems; Reliability;
