Accelerated aging studies of multi-section tunable GCSR lasers for dense WDM applications

Author

Lavrova, Olga A. ; Blumenthal, Daniel J.

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

Volume

18

Issue

12

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

2196

Lastpage

2199

Abstract

The first accelerated aging study of wavelength tunable packaged sampled grating reflector (GCSR) lasers is reported. Stable power and SMSR were observed during the 5000 hours of operation at elevated temperatures. Frequency shifts of the selected lasing channels were characterized to access potential failures in an optical network. A longer burn-in was found to significantly reduce the amount of the observed shifts, and hence increase the reliability of the device. The effective room-temperature lifetime of GCSR is estimated to be 13.4 y. A new end-of-life criteria is also proposed.

Keywords

diffraction gratings; laser tuning; life testing; optical transmitters; semiconductor device reliability; semiconductor device testing; semiconductor lasers; wavelength division multiplexing; 13.4 y; 5000 h; SMSR; accelerated aging studies; access potential failures; dense WDM applications; effective room-temperature lifetime; elevated temperatures; end-of-life criteria; frequency shifts; longer burn-in; multi-section tunable GCSR lasers; optical network; reliability; sampled grating reflector lasers; selected lasing channels; stable power; wavelength tunable packaged GCSR lasers; Accelerated aging; Distributed Bragg reflectors; Frequency; Gratings; Laser modes; Laser tuning; Semiconductor lasers; Testing; Tunable circuits and devices; Wavelength division multiplexing;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.908832

Filename

908832