Title :
High-speed, high-reliability planar-structure superlattice avalanche photodiodes for 10-Gb/s optical receivers
Author :
Watanabe, Isao ; Nakata, Takeshi ; Tsuji, Masayoshi ; Makita, Kikuo ; Torikai, Toshitaka ; Taguchi, Kencho
Author_Institution :
Photonic & Wireless Devices Res. Labs., NEC Corp., Ibaraki, Japan
fDate :
12/1/2000 12:00:00 AM
Abstract :
This paper reports the planar-structure InAl-GaAs-InAlAs superlattice avalanche photodiodes (SL-APDs) with a Ti-implanted guard-ring, which were developed for a compact and high-sensitivity 10-Gb/s optical receiver application. The design and fabrication of the novel concept planar-structure including the Ti-implanted guard-ring are described. The characteristics of the planar APDs are 0.36 /spl mu/A dark current at a multiplication factor of 10, 67% quantum efficiency, 110-GHz gain-bandwidth (GB) product, 15-GHz top-bandwidth, and - 27.2-dBm sensitivity at 10 Gb/s. The reliability was preliminary tested and the lifetime of longer than 10/sup 7/ h at 50/spl deg/C was estimated. The dark current characteristics including its temperature dependence and the excess noise characteristics are also analyzed. All the obtained characteristics exhibit the practical availability of the planar SL-APDs in the 10-Gb/s trunk line optical receiver uses.
Keywords :
III-V semiconductors; avalanche photodiodes; carrier lifetime; dark conductivity; gallium arsenide; indium compounds; optical receivers; semiconductor device reliability; semiconductor superlattices; sensitivity; 0.36 muA; 10 Gbit/s; 50 C; 67 percent; Gb/s optical receivers; Gb/s trunk line optical receiver; InAl-GaAs-InAlAs; InAl-GaAs-InAlAs superlattice avalanche photodiodes; Ti; Ti-implanted guard-ring; dark current; dark current characteristics; excess noise characteristics; high-sensitivity; high-speed high-reliability planar-structure superlattice avalanche photodiodes; multiplication factor; optical design; optical fabrication; planar-structure; quantum efficiency; reliability; sensitivity; temperature dependence; Avalanche photodiodes; Dark current; Life estimation; Life testing; Lifetime estimation; Optical device fabrication; Optical noise; Optical receivers; Superlattices; Temperature dependence;
Journal_Title :
Lightwave Technology, Journal of