DocumentCode
1450478
Title
A 32-Mb SPRAM With 2T1R Memory Cell, Localized Bi-Directional Write Driver and `1´/`0´ Dual-Array Equalized Reference Scheme
Author
Takemura, Riichiro ; Kawahara, Takayuki ; Miura, Katsuya ; Yamamoto, Hiroyuki ; Hayakawa, Jun ; Matsuzaki, Nozomu ; Ono, Kazuo ; Yamanouchi, Michihiko ; Ito, Kenchi ; Takahashi, Hiromasa ; Ikeda, Shoji ; Hasegawa, Haruhiro ; Matsuoka, Hideyuki ; Ohno, Hid
Author_Institution
Central Res. Lab., Hitachi, Ltd., Kokubunji, Japan
Volume
45
Issue
4
fYear
2010
fDate
4/1/2010 12:00:00 AM
Firstpage
869
Lastpage
879
Abstract
A 32-Mb SPin-transfer torque RAM (SPRAM) chip was demonstrated with an access time of 32 ns and a cell write-time of 40 ns at a supply voltage of 1.8 V. The chip was fabricated with 150-nm CMOS and a 100 Ã 200-nm tunnel magneto-resistive (TMR) device element. A required thermal stability of 67 of the TMR device was estimated by taking into account the disturbances during read operations and data retention periods of 10 years for nonvolatile operation. The 32-Mb SPRAM chip features three circuit technologies suitable for a large-scale array: 1) a two-transistor, one-resistor (2T1R) type memory cell for achieving a sufficiently large write current despite the small cell size, 2) a compact read/write separated hierarchy bit/source-line structure with a localized bi-directional write driver for efficiently distributing write current, and 3) a ´1´/´0´ dual-array equalized reference scheme for stable read operation.
Keywords
CMOS integrated circuits; driver circuits; random-access storage; thermal stability; write-once storage; 2T1R memory cell; CMOS integrated circuit; SPRAM chip; bit/source-line structure; data retention periods; dual-array equalized reference scheme; localized bi-directional write driver; nonvolatile operation; one-resistor type memory cell; size 150 nm; spin-transfer torque RAM; storage capacity 32 Mbit; thermal stability; time 32 ns; time 40 ns; tunnel magneto-resistive device element; two-transistor type memory cell; voltage 1.8 V; Bidirectional control; Circuit stability; Magnetic devices; Magnetic separation; Nonvolatile memory; Random access memory; Read-write memory; Thermal stability; Torque; Voltage; 2T1R memory cell; TMR; localized bi-directional write driver; low-power RAM; nonvolatile RAM; spin-transfer torque; universal memory;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2010.2040120
Filename
5437480
Link To Document