• DocumentCode
    1450484
  • Title

    A 0.5 V Sub-Microwatt CMOS Image Sensor With Pulse-Width Modulation Read-Out

  • Author

    Hanson, Scott ; Foo, Zhiyoong ; Blaauw, David ; Sylvester, Dennis

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    45
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    759
  • Lastpage
    767
  • Abstract
    Energy minimization is a critical goal in size-constrained wireless sensors. Sensing elements are traditionally power hungry and require special attention in low energy systems. In this work, we study ultra-low power image sensors. In particular, we explore the use of aggressive voltage scaling in CMOS image sensors for applications ranging from retinal prostheses to battlefield monitoring and surveillance. We begin with a discussion of the challenges faced by a traditional 3T active pixel sensor as the supply voltage scales to 0.5 V and below. We then discuss an image sensor with pulse-width modulation read-out that is optimized for 0.5 V operation. A 0.13 ¿m test-chip with a 128 × 128 pixel array is shown to be functional with Vdd as low as 0.45 V with energy consumption of 140 nJ/frame at Vdd = 0.5 V (8.5 frames per second) and power consumption of only 700 nW at Vdd = 0.5 V (0.5 frames per second). A focus is also placed on quantifying the noise implications of low voltage operation on the test-chip, which has a measured signal-to-noise ratio of 23.4 dB in saturation at Vdd = 0.5 V.
  • Keywords
    CMOS image sensors; low-power electronics; power consumption; pulse width modulation; CMOS image sensor; energy consumption; energy minimization; pixel sensor; power 700 nW; power consumption; pulse-width modulation read-out; signal-to-noise ratio; size 0.13 mum; voltage 0.5 V; CMOS image sensors; Energy consumption; Image sensors; Pulse modulation; Retina; Signal to noise ratio; Space vector pulse width modulation; Testing; Voltage; Wireless sensor networks; Image sensor; low power; low voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2040231
  • Filename
    5437481