Title :
A 0.6 mW/Gb/s, 6.4–7.2 Gb/s Serial Link Receiver Using Local Injection-Locked Ring Oscillators in 90 nm CMOS
Author :
Hu, Kangmin ; Jiang, Tao ; Wang, Jingguang ; O´Mahony, Frank ; Chiang, Patrick Yin
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
fDate :
4/1/2010 12:00:00 AM
Abstract :
This paper describes a quad-lane, 6.4-7.2 Gb/s serial link receiver prototype using a forwarded clock architecture. A novel phase deskew scheme using injection-locked ring oscillators (ILRO) is proposed that achieves greater than one UI of phase shift for multiple clock phases, eliminating phase rotation and interpolation required in conventional architectures. Each receiver, optimized for power efficiency, consists of a low-power linear equalizer, four offset-cancelled quantizers for 1:4 demultiplexing, and an injection-locked ring oscillator coupled to a low-voltage swing, global clock distribution. Measurement results show a 6.4-7.2 Gb/s data rate with BER < 10-12 across 14 cm of PCB, and also an 8.0 Gb/s data rate through 4 cm of PCB. Designed in a 1.2 V, 90 nm CMOS process, the ILRO achieves a wide tuning range from 1.6-2.6 GHz. The total area of each receiver is 0.0174 mm2, resulting in a measured power efficiency of 0.6 mW/Gb/s.
Keywords :
CMOS integrated circuits; UHF oscillators; clocks; demultiplexing; equalisers; injection locked oscillators; receivers; CMOS process; bit rate 6.4 Gbit/s to 7.2 Gbit/s; demultiplexing; forwarded clock architecture; frequency 1.6 GHz to 2.6 GHz; global clock distribution; interpolation; local injection-locked ring oscillators; low-power linear equalizer; low-voltage swing; multiple clock phases; offset-cancelled quantizers; phase deskew scheme; phase rotation; phase shift; power efficiency; serial link receiver; size 90 nm; voltage 1.2 V; Area measurement; Bit error rate; CMOS process; Clocks; Demultiplexing; Equalizers; Interpolation; Prototypes; Ring oscillators; Tuning; Injection-locked oscillator; receiver; serial link;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2010.2040116