• DocumentCode
    1450541
  • Title

    Characteristics of spectral-hole burning of InAs self-assembled quantum dots

  • Author

    Sugiyama, Yoshihiro ; Nakata, Yoshiaki ; Muto, Shunichi ; Futatsugi, Toshiro ; Yokoyama, Naoki

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • Volume
    4
  • Issue
    5
  • fYear
    1998
  • Firstpage
    880
  • Lastpage
    885
  • Abstract
    Spectral-hole burning of InAs self-assembled quantum dots (QDs) embedded in pin-diode was observed. At 5 K, a narrow hole with width of less than 1 mm was observed and the hole depth increased as electric field increased with the writing light power of 8 mW. The hole was observed up to 40 K. The spectral hole was broadened as the writing light power increases from 8 to 20 mW. Spectral-hole width at the 8 mW was well fitted with the convolution integral of Gaussian distribution for reading light and Lorentzian distribution for absorption change taking into account homogeneous broadening of InAs QDs of ⩽80 μeV. Spectral-hole lifetime at the 8 mW was estimated to be in the order of 10-6 s. Optical absorption spectrum of 15-stacked InAs QD structure was also observed at 77 K and 300 K
  • Keywords
    III-V semiconductors; indium compounds; optical hole burning; p-i-n diodes; self-assembly; semiconductor quantum dots; 5 to 40 K; 8 to 20 mW; Gaussian distribution; InAs; InAs self-assembled quantum dot; Lorentzian distribution; convolution integral; homogeneous broadening; multiple stack; optical absorption spectrum; pin diode; spectral hole burning; Absorption; Gallium arsenide; Light sources; Nonlinear optics; Optical devices; P-i-n diodes; Physics; Quantum dots; US Department of Transportation; Writing;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.735774
  • Filename
    735774