• DocumentCode
    1450610
  • Title

    High Thermal Stability of Phosphor-Converted White Light-Emitting Diodes Employing Ce:YAG-Doped Glass

  • Author

    Wang, Jimmy ; Tsai, Chun-Chin ; Cheng, Wei-Chih ; Chen, Ming-Hung ; Chung, Cheng-Hsun ; Cheng, Wood-Hi

  • Author_Institution
    Dept. of Photonics, Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • Volume
    17
  • Issue
    3
  • fYear
    2011
  • Firstpage
    741
  • Lastpage
    746
  • Abstract
    High thermal stability of phosphor-converted white light-emitting diodes (PC-WLEDs) using Ce:YAG-doped glass (CeYDG), instead of conventional Ce:YAG-doped silicone (CeYDS), as a PC layer is proposed and fabricated. The proposed CeYDG possesses host stability as glass and retains desired fluorescence as Ce:YAG. The CeYDG employed in the PC-WLED test demonstrates better performances than conventional CeYDS, including lumen loss, chromaticity shift, transmittance loss, and peak emission intensity undergoing three industry-standard reliability tests at either high (8 wt%) or low (2 wt%) doping concentrations of Ce:YAG. While the CeYDG reveals better stability than the CeYDS, we expect even better performance after refining the glass composition and fabrication process for CeYDG due to current processing facility limitations. However, this study clearly demonstrates the feasibility and advantages of adapting glass as a PC layer in PC-WLED modules that can potentially provide higher reliability and better performance for high-end LEDs, particularly in the area where strict reliability is highly required and in the environment where silicone fails to stand for long.
  • Keywords
    cerium; chemical analysis; doping profiles; fluorescence; light emitting diodes; optical fabrication; optical glass; optical losses; optical testing; phosphors; reliability; silicon compounds; spectral line shift; thermal stability; transparency; Ce:YAG-doped glass; PC-WLED test; chromaticity shift; doping concentration; fluorescence; glass composition; industry-standard reliability test; lumen loss; optical fabrication; peak emission intensity; phosphor-converted white light-emitting diodes; thermal stability; transmittance loss; Aging; Glass; Light emitting diodes; Propagation losses; Thermal expansion; Thermal stability; Aging test; Ce:YAG-doped glass (CeYDG); Ce:YAG-doped silicone (CeYDS); high-power LED modules; phosphor-converted white light-emitting diodes (PC-WLEDs); reliability;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2010.2096459
  • Filename
    5713808