Title :
A 300-kpixel Ultrahigh-Speed Charge-Coupled Device With a Dynamic Range of 48.6 dB at 1 Million Frames per Second
Author :
Arai, Toshiki ; Kitamura, Kazuya ; Yonai, Jun ; Ohtake, Hiroshi ; Hayashida, Tetsuya ; Maruyama, Hirotaka ; Van Kuijk, Harry ; Etoh, Takeharu Goji
Author_Institution :
NHK Sci. & Technol. Res. Labs., Tokyo, Japan
fDate :
4/1/2012 12:00:00 AM
Abstract :
An ultrahigh-speed charge-coupled device (CCD) with an increased dynamic range at a frame rate above 200 kiloframes per second (kfps) was developed. The dynamic range of a CCD operating at extremely high speeds is reduced as a result of rounding of a sharp voltage waveform inside the device. The amount of rounding was estimated by using an equivalent circuit model of one kind of electrodes in a four-phase CCD memory. The simulation showed that the calculated voltage at a quarter period and the measured saturation signal level have similar dependence on the frame rate. To suppress the drop in voltage at a quarter period, the active pixels and the driving circuit were divided, and the resistance of the pixel wiring was reduced. A new ultrahigh-speed CCD, whose active pixels are divided into eight separately driven blocks and that employs dual wirings to each electrode of the four-phase CCD memory, was designed and fabricated. A driving evaluation experiment showed that the ultrahigh-speed CCD had a dynamic range of 48.6 dB at 1 000 000 fps. This range is equivalent to 8-bit digital and is 2.5 times higher than that of a previous ultrahigh-speed CCD.
Keywords :
CCD image sensors; driver circuits; electrodes; equivalent circuits; storage management chips; CCD dynamic range; CCD image sensors; driving circuit; drop suppression; electrodes; equivalent circuit model; four-phase CCD memory; frame rate; picture size 300 kpixel; pixel wiring resistance; saturation signal level; sharp voltage waveform rounding; ultrahigh-speed charge-coupled device; word length 8 bit; Charge coupled devices; Dynamic range; Electrodes; Equivalent circuits; Integrated circuit modeling; Resistance; Wiring; Charge-coupled device (CCD) image sensors; dynamic range; high-speed electronics;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2184117