Title :
Impact of Time-Varying Loads on the Programmable Pulsed Power Driver Called Genesis
Author :
Glover, Steven F. ; Davis, J.-P. ; Schneider, Larry X. ; Reed, K.W. ; Pena, Gary E. ; Hall, C.A. ; Hanshaw, H.L. ; Hickman ; Hodge, K.C. ; Lemke, R.W. ; Lehr, Jane M. ; Lucero, Diego J. ; McDaniel, Dillon H. ; Puissant, J.G. ; Rudys, Joseph M. ; Sceiford,
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
The success of dynamic materials properties research at Sandia National Laboratories has led to research into ultralow impedance, compact pulsed power systems capable of multi-MA shaped current pulses with rise times ranging from 220 to 500 ns. The Genesis design consists of two hundred and forty 200 kV, 80 kA modules connected in parallel to a solid dielectric disk transmission line and is capable of producing 280 kbar of magnetic pressure (>; 500 kbar pressure in high Z materials) in a 1.75 nH, 20-mm wide stripline load. Stripline loads operating under these conditions expand during the experiment resulting in a time-varying load that can impact the performance and lifetime of the system. This paper provides analysis of time-varying stripline loads and the impact of these loads on system performance. Further, an approach to reduce dielectric stress levels through active damping is presented as a means to increase system reliability and lifetime.
Keywords :
driver circuits; genetic algorithms; pulsed power supplies; reliability; transmission lines; compact pulsed power systems; current 80 kA; dielectric stress levels; genesis; programmable pulsed power driver; solid dielectric disk transmission line; system reliability; time 220 ns to 500 ns; time-varying stripline loads; voltage 200 kV; Electrodes; Inductance; Magnetic separation; Magnetohydrodynamics; Magnetomechanical effects; Materials; Stripline; Current control; dynamic load; equation of state; genetic algorithms; isentropic compression; modeling; programmable control; pulse shaping; pulsed power;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2012.2185070