• DocumentCode
    1450994
  • Title

    Test response compaction using multiplexed parity trees

  • Author

    Chakrabarty, Krishnendu ; Hayes, John P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Boston Univ., MA, USA
  • Volume
    15
  • Issue
    11
  • fYear
    1996
  • fDate
    11/1/1996 12:00:00 AM
  • Firstpage
    1399
  • Lastpage
    1408
  • Abstract
    Built-in self-testing requires test response streams from many observation points to be merged (space compaction) and compressed (time compaction) into a short signature. The compaction circuits should be transparent to error propagation in order to minimize aliasing, which occurs when a faulty response maps to the fault-free signature. We investigate the use of multiplexed parity trees (MPTs) for zero-aliasing space compaction. MPTs combine the error propagation properties of multiplexers and parity trees, and ensure zero aliasing via multistep compaction. We present two design techniques based on MPTs-output selection and fanout insertion-that eliminate aliasing for both deterministic and pseudorandom test sets. Our experiments with the ISCAS benchmark circuits show that zero aliasing can be achieved with small test sets and moderate hardware overhead. We also demonstrate that a very high percentage of single stuck-line faults in the compaction circuit are detected by the test patterns applied to the circuit under test
  • Keywords
    built-in self test; multiplexing; parity; trees (mathematics); built-in self-testing; compaction circuit; error propagation; fanout insertion; multiplexed parity tree; multistep compaction; output selection; signature; stuck-line fault detection; test response; zero-aliasing space compaction; Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Electrical fault detection; Fault detection; Hardware; Multiplexing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.543772
  • Filename
    543772