Title :
Size Distribution and Anisotropy Effects on the Switching Field Distribution of Co/Pd Multilayered Nanostructure Arrays
Author :
Smith, Darren T. ; Chang, Long ; Rantschler, James O. ; Kalatsky, Valery ; Ruchhoeft, Paul ; Khizroev, Sakhrat ; Litvinov, Dmitri
Author_Institution :
Electr. & Comput. Eng., Univ. of Houston, Houston, TX, USA
Abstract :
We use ion beam proximity lithography (IBPL) to produce 4 mm times 4 mm arrays of 220-nm dots in perpendicularly oriented Co/Pd multilayered media. A novel technique of overlapping neighbors is used with IBPL to generate samples with controllable size distribution sigmaD of the nanoarrays. The switching field distribution sigmaHcr/HCr is measured for each sample before and after irradiation, and a linear relationship is experimentally found between sigmaHcr/HCr and sigmaD. Empirical calculations support our determination that self-demagnetization fields are responsible for a portion of the switching field distribution. Using the zero intercept of the experimental data, we find the inherent anisotropy distribution in the Co/Pd samples is on the order of 10%. We further irradiate the samples with He+ ions to alter the anisotropy and better understand the role of shape anisotropy. As interface anisotropy is reduced in the Co/Pd bit-patterned medium (BPM) samples, shape anisotropy has a much greater contribution on the switching field distribution of the BPM samples.
Keywords :
cobalt; demagnetisation; ion beam effects; ion beam lithography; magnetic multilayers; magnetic structure; magnetic switching; nanolithography; nanostructured materials; palladium; perpendicular magnetic anisotropy; Co-Pd; He+ ion irradiation; anisotropy effects; bit-patterned medium samples; controllable size distribution; inherent anisotropy distribution; ion beam proximity lithography; multilayered nanostructure arrays; perpendicularly oriented multilayered media; self-demagnetization fields; size 220 nm; size distribution; switching field distribution; Magnetic multilayers; patterned magnetic arrays; switching field distribution;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2009.2025186