Title :
Characteristic Length Scale for Spin Polarized Tunneling in Langmuir-Blodgett Molecular Magnetic Tunnel Junction
Author :
Liu, Dongping ; Hu, Yibin ; Guo, Hong ; Han, X.F.
Author_Institution :
State Key Lab. of Magn., Chinese Acad. of Sci., Beijing, China
Abstract :
Using ab initio methods, we have calculated the characteristic inverse length scale for spin polarized tunneling in Langmuir-Blodgett (LB) films contacted by Fe electrodes. As a function of energy, the scale is found to vary significantly around its mean value, and the variation is much more drastic in parallel configuration than that of anti-parallel configuration. This unusual behavior can be understood from the point of view of interface resonance, which shows very sharp features in the k-space resolved transmission probability.
Keywords :
Langmuir-Blodgett films; ab initio calculations; electrodes; iron; magnetic thin films; magnetic tunnelling; molecular magnetism; spin polarised transport; Fe; Fe electrodes; Langmuir-Blodgett films; Langmuir-Blodgett molecular magnetic tunnel junction; ab initio methods; antiparallel configuration; characteristic inverse length scale; interface resonance; k-space resolved transmission probability; parallel configuration; spin polarized tunneling; Magnetoresistance; magnetoresistive devices;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2009.2025253