Title :
Modeling and Testing of Ethernet Transformers
Author :
Bowen, David ; Mayergoyz, Isaak D. ; Zhang, Zhenyu ; McAvoy, Patrick ; Krafft, Charles ; Kroop, David
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Maryland, College Park, MD, USA
Abstract :
In this paper, novel techniques for the testing and identification of lumped parameters of equivalent circuits for Ethernet transformers are presented. It is demonstrated experimentally and theoretically that resonance phenomena may occur in the loop formed by leakage inductances and cross-winding capacitance. This resonance may corrupt the pass band of the transformers transfer characteristic for differential-mode signals.
Keywords :
local area networks; transformers; Ethernet transformers; cross-winding capacitance; differential-mode signals; leakage inductances; lumped parameters identification; lumped parameters testing; resonance phenomena; transformers transfer characteristic; Equivalent circuits; modeling; soft magnetic materials; transformer windings;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2009.2023918
