Title :
Design and analysis of six port-TEM cell for generating standard electromagnetic fields
Author :
Yun, J.H. ; Lee, H.J. ; Kim, J.K.
Author_Institution :
Sect. of Radio Sci., Electron. & Telecommun. Res. Inst., Taejeon, South Korea
fDate :
11/7/1996 12:00:00 AM
Abstract :
The authors report the design and analysis of a six port-TEM cell. The cell is especially useful for EMI/EMC testing since it maximises the test area with high field uniformity in the transverse section and changes the polarisation of fields easily. The measured electric fields inside the cell agree well with the calculated results
Keywords :
electromagnetic compatibility; electromagnetic fields; electromagnetic interference; test equipment; EMI/EMC testing; electric fields; field polarisation; field uniformity; six port-TEM cell; standard electromagnetic fields; test area; transverse section;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961430
