Title :
Multiferroic Properties of BiFeO
Ceramic and Thin Film and BiFeO
/Co/BiFeO
Author :
Wang, Z.-H. ; Ding, Y. ; Tu, C.S. ; Lin, T.-C. ; Yao, Y.D. ; Wu, K.T.
Author_Institution :
Grad. Inst. of Appl. Sci. & Eng., Fu Jen Catholic Univ., Taipei, Taiwan
Abstract :
In situ X-ray diffraction of BiFeO3 (BFO) ceramic and thin film has been carried out as a function of temperature (25degC-900degC) upon heating. The BFO thin film was deposited on Pt/TiOx/SiOx/Si(100) substrate by radio-frequency magnetron sputtering at 650degC. BFO thin film exhibits a structural transformation from rhombohedral to cubic in the region of 700-750degC upon heating. The magnetic property of BiFeO3/Co/BiFeO3 multilayer structure changes from diamagnetic to ferromagnetic phases with increasing thickness of Co layer. The dielectric permittivities (real and imaginary parts) of BiFeO3 ceramic exhibit a frequency-dependent relaxation-like behavior and its magnitude (real part) is higher than 1000 for f les 1 MHz. Surface morphology shows that the root-mean-square roughness of BFO thin film varies with sputtering power.
Keywords :
X-ray diffraction; bismuth compounds; ceramics; cobalt; diamagnetic materials; dielectric relaxation; ferromagnetic materials; magnetic multilayers; magnetic thin films; magnetisation; multiferroics; permittivity; solid-state phase transformations; sputter deposition; surface morphology; surface roughness; BiFeO3-Co-BiFeO3; Pt-TiOx-SiOx-Si; ceramics; diamagnetic phase; dielectric permittivity; ferromagnetic phase; frequency-dependent relaxation-like behavior; in situ X-ray diffraction; magnetic property; magnetisation; multiferroic property; multilayer structure; radio-frequency magnetron sputtering; rhombohedral-cubic transformation; root-mean-square roughness; structural transformation; surface morphology; temperature 25 C to 900 C; thin films; BiFeO $_{3}$; dielectric permittivity; films; magnetoelectric;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2009.2025254