Title :
The third millennium´s test dilemma
Author_Institution :
Credence Syst. Corp., Fremont, CA, USA
Abstract :
The president and CEO of Credence Systems, Bill Bottoms, addressed the VLSI test symposium held last April in Monterey, California. His keynote covered some of the challenges test engineers must face in the future. Specifically, Bottoms focused on what´s driving the increase in test cost and what the industry can do about it
Keywords :
VLSI; integrated circuit testing; VLSI test symposium; test cost; Acceleration; Automatic testing; Circuit optimization; Costs; Integrated circuit testing; Logic; Microprocessors; Moore´s Law; System testing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
