Title :
Online BIST for embedded systems
Author :
Al-Asaad, Hussain ; Murray, Brian T. ; Hayes, John P.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Abstract :
Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey online-testing techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach
Keywords :
built-in self test; embedded systems; integrated circuit testing; reliability; built-in self-test; comprehensive testing approach; embedded systems; high reliability; online BIST; safety; system failure; Application software; Automatic testing; Built-in self-test; Computer bugs; Costs; Embedded system; Fault detection; Hardware; Safety; Software testing;
Journal_Title :
Design & Test of Computers, IEEE
