Title :
Online current testing
Author_Institution :
Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
Abstract :
Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications
Keywords :
VLSI; fault tolerance; integrated circuit testing; design complexity; fault coverage; fault-tolerant applications; online VLSI testing; online current testing; product value; reliability problems; safety level; Alpha particles; Availability; Circuit faults; Circuit testing; Fault tolerance; Fixtures; Integrated circuit testing; Manufacturing; Safety; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
