Title :
On-chip IDDQ testing in the AE11 fail-stop controller
Author :
Böhl, Eberhard ; Lindenkreuz, Thomas ; Meerwein, Matthias
Author_Institution :
Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany
Abstract :
Targeted for safety-critical applications, this microcontroller replaces the classic two-controller safety structure with a single controller containing various online fault detection measures. To minimize chip area without reducing safety, the developers incorporated a combination of concurrent checking, BIST, and IDDQ testing-and considerably extended the standard cell-based design flow
Keywords :
built-in self test; integrated circuit testing; microcontrollers; AE11 fail-stop controller; BIST; IDDQ testing; concurrent checking; microcontroller; on-chip IDDQ testing; online fault detection measures; safety-critical applications; standard cell-based design flow; two-controller safety structure; Application software; Built-in self-test; Circuit faults; Clocks; Fault detection; Logic testing; Pulse width modulation; Safety; Software testing; Temperature control;
Journal_Title :
Design & Test of Computers, IEEE
