Title :
Fault analysis for networks with concurrent error detection
Author :
Bolchini, Cristiana ; Salice, Fabio ; Sciuto, Donatella
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
Abstract :
The authors propose an approach for fault analysis and simulation of networks designed to have concurrent detection properties. The analysis characterizes all faults that may affect a device and determines the coverage, extracting test vectors and other parameters for evaluating device quality
Keywords :
error detection; fault location; integrated circuit testing; device quality; fault analysis; networks with concurrent error detection; test vectors; Arithmetic; Circuit faults; Circuit synthesis; Computer errors; Electrical fault detection; Encoding; Fault detection; Logic; Network synthesis; Testing;
Journal_Title :
Design & Test of Computers, IEEE