Title :
Using laser defect avoidance to build large-area FPGAs
Author :
Chapman, Glenn H. ; Dufort, Benoit
Author_Institution :
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Abstract :
Wafer-scale techniques of defect avoidance expend the complexity limits of field-programmable gate arrays by routing around flawed blocks to build working systems. Experiments on test FPGAs show that laser defect avoidance produces signal delays half those of active switches
Keywords :
computational complexity; delays; field programmable gate arrays; logic arrays; defect avoidance; field-programmable gate arrays; large-area FPGAs; laser defect avoidance; signal delays; wafer-scale techniques; CMOS technology; Circuits; Delay; Field programmable gate arrays; Laser beam cutting; Optical design; Redundancy; Routing; Switches; Testing;
Journal_Title :
Design & Test of Computers, IEEE
