DocumentCode :
1451623
Title :
A D&T Roundtable Deep-Submicron Noise
Author :
MacDonald
Volume :
15
Issue :
4
fYear :
1998
Firstpage :
82
Lastpage :
88
Keywords :
Circuit noise; Circuit testing; Coupling circuits; Crosstalk; Delay; Frequency; Hardware; Integrated circuit noise; Latches; Wire;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1998.735931
Filename :
735931
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1451623
