Autocorrelation testing of combinational circuits

This paper considers autocorrelation testing for the detection of single stuck-at-faults on non-syndrome testable input lines of an internally unate combinational network. The question of an autocorrelation test covering more than one input fault is considered. Also a test circuitry which requires only 2" input assignments for an n-input system is presented. The work of this paper is an extension of previous work on autocorrelation testing by E. Eris and J.C. Muzio (1984).