DocumentCode
1451985
Title
Investigation of Hardening Measures for IT Equipment against Radiated and Conducted IEMI
Author
Brauer, Florian ; Fahlbusch, Sebastian ; Haseborg, Jan Luiken ter ; Potthast, Stefan
Author_Institution
Dept. of Meas. Technol. & Electromagn. Compatibility, Hamburg Univ. of Technol., Hamburg, Germany
Volume
54
Issue
5
fYear
2012
Firstpage
1055
Lastpage
1065
Abstract
Intentional electromagnetic interferences are a serious threat for electronic systems (e.g., IT communication systems) in military or civilian applications and structures. In this paper, different hardening measures for susceptible coupling paths of an IT system are developed and investigated under different high-power electromagnetic conditions. The behavior of adapted nonlinear protection circuits and linear filters, which are integrated into the test system, as well as modifications on an enclosure is investigated by measurements and simulations with radiated and conducted disturbance signals using ultrawideband, high-power microwave, and damped sinusoidal sources. The influence of the protection measures on the data transmission error rates during disturbance is additionally investigated. The results lead to statements about future protection concepts for IT equipment and other vulnerable electronic systems.
Keywords
electromagnetic interference; filters; hardening; information technology; IT equipment; IT system; adapted nonlinear protection circuit; civilian application; conducted IEMI; damped sinusoidal source; data transmission error rate; disturbance signal; hardening measures; high-power electromagnetic condition; high-power microwave source; intentional electromagnetic interferences; linear filter; military application; susceptible coupling path; ultrawideband source; vulnerable electronic system; Couplings; Data communication; Electromagnetics; Optical switches; Power supplies; Transfer functions; Hardening; high-power electromagnetic (HPEM); intentional electromagnetic interferences (IEMI); protection;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2012.2183134
Filename
6155087
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