DocumentCode :
1452045
Title :
Corrugated Quantum-Well Infrared Photodetector Focal Plane Arrays
Author :
Choi, Kwong-Kit ; Forrai, David P. ; Endres, Darrel W. ; Sun, Jason
Author_Institution :
U.S. Army Res. Lab., Adelphi, MD, USA
Volume :
45
Issue :
10
fYear :
2009
Firstpage :
1255
Lastpage :
1264
Abstract :
Corrugated quantum-well infrared photodetectors (C-QWIPs) have been proposed for long-wavelength infrared detection. In this work, we optimize the detector structure and produce a number of large format focal plane arrays (FPAs). Specifically, we adopt one-corrugation-per-pixel geometry to increase the active detector volume and incorporate a composite cover layer to preserve the large sidewall reflectivity, which results in a large detector quantum efficiency. We also optimize the detector material structure such as the final state energy, the doping density, and the number of quantum well periods to improve the FPA operation under the existing readout electronics. As a result, high FPA sensitivity has been achieved, and their characteristics are in agreement with the detector model. Based on this model, we perform a systematic analysis on the FPA performance with a wide range of detector and system parameters. We find that C-QWIP FPAs are capable of high-speed imaging especially for those with longer cutoff wavelengths.
Keywords :
doping profiles; focal planes; infrared detectors; photodetectors; quantum well devices; reflectivity; semiconductor device models; FPA; corrugated quantum-well infrared photodetectors; doping density; focal plane arrays; high-speed imaging; infrared photodetector; long-wavelength infrared detection; one-corrugation-per-pixel geometry; quantum efficiency; sidewall reflectivity; Doping; Geometry; Infrared detectors; Performance analysis; Photodetectors; Quantum wells; Readout electronics; Reflectivity; Semiconductor process modeling; Sensor arrays; Focal plane array; infrared detector; quantum efficiency;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2009.2026185
Filename :
5257460
Link To Document :
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