DocumentCode :
1452264
Title :
Microwave-assisted grinding
Author :
Walkiewicz, John W. ; Clark, Andrea E. ; McGill, Sandra L.
Author_Institution :
US Bur. of Mines, Reno Res. Center, NV, USA
Volume :
27
Issue :
2
fYear :
1991
Firstpage :
239
Lastpage :
243
Abstract :
The US Bureau of Mines has conducted studies on the use of rapid microwave heating to stress-fracture ore samples. Iron ores containing hematite, magnetite, and goethite were subjected to microwave energy in batch operations at 3 kW and heated to average maximum temperatures between 840 and 940°C. Scanning electron microscope (SEM) photomicrographs verified fracturing along grain boundaries and throughout the gangue matrix. Standard bond grindability tests showed that microwave heating reduced the work index of iron ores by 10 to 24%. When a continuous feed belt in a microwave applicator was used, samples heated more uniformly and quickly than in batch operations. In a microwave chamber designed to simulate a continuous throughput operation at 3 kW, the grindability of a taconite ore was improved by 13% at a bulk temperature of 197°C. Because stress cracking occurred at a lower temperature, less energy was consumed, thereby improving the cost effectiveness of microwave-assisted grinding. To further improve the economics of microwave fracturing, preliminary tests were conducted to increase heating rates by using higher microwave powers. To appraise the economic feasibility of microwave-assisted grinding, the beneficial effects in the grinding circuit and in the extractive operation were considered
Keywords :
fracture; grinding; mineral processing industry; minerals; radiofrequency heating; stress corrosion cracking; 197 degC; 3 kW; 840 to 940 degC; SEM; USA; economics; gangue matrix; grain boundaries; grindability; grinding; iron ores; microwave heating; minerals; mining; photomicrographs; stress cracking; stress-fracture; tests; work index; Bonding; Electromagnetic heating; Feeds; Grain boundaries; Iron; Ores; Power generation economics; Scanning electron microscopy; Temperature; Testing;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.73604
Filename :
73604
Link To Document :
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