DocumentCode :
1452626
Title :
Silicon-on-silicon rib waveguides with a high-confining ion-implanted lower cladding
Author :
Cocorullo, Giuseppe ; Della Corte, Francesco G. ; Iodice, Mario ; Rendina, Ivo ; Sarro, Pasqualina M.
Author_Institution :
I.R.E.C.E., CNR, Naples, Italy
Volume :
4
Issue :
6
fYear :
1998
Firstpage :
983
Lastpage :
989
Abstract :
The realization of single-mode rib waveguides in standard epitaxial silicon layer on lightly doped silicon substrate, using ion implantation to form the lower cladding, is reported. The implanted buffer layer enhances´ the vertical confinement and improves the propagation characteristics. Respect to similar standard all-silicon waveguides a propagation loss reduction of about 7 dB/cm, in the single-mode regime, has been measured. A numerical analysis has been performed to evaluate the theoretical attenuation and the transverse optical field profiles. As a result of the presence of the ion implanted buffer layer, an increase of the fundamental mode confinement factor from 0.3 to 0.85 has been calculated. This results in a great enhancement of the coupling efficiency with standard single-mode optical fibers. Moreover, the proposed technique is low cost, fully compatible with standard VLSI processes, and allows a great flexibility in the integration of guided-wave devices and electronic circuits. Finally, the very high thermal conductivity characterizing these waveguides makes them attractive host-structures for electrically and thermally controlled active optical devices
Keywords :
VLSI; claddings; integrated optoelectronics; ion implantation; optical losses; optical planar waveguides; rib waveguides; silicon; silicon-on-insulator; coupling efficiency; electrically controlled active optical devices; fundamental mode confinement factor; guided-wave devices; high-confining ion-implanted lower cladding; host-structures; implanted buffer layer; ion implanted buffer layer; lightly doped silicon substrate; low cost fully compatible VLSI processes; lower cladding; numerical analysis; propagation characteristics; propagation loss reduction; silicon-on-silicon rib waveguides; single-mode regime; single-mode rib waveguides; standard all-silicon waveguides; standard epitaxial silicon layer; theoretical attenuation; thermally controlled active optical devices; transverse optical field profiles; vertical confinement; very high thermal conductivity; Buffer layers; Ion implantation; Measurement standards; Optical attenuators; Optical propagation; Optical waveguide theory; Optical waveguides; Silicon; Substrates; Thermal conductivity;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.736091
Filename :
736091
Link To Document :
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