DocumentCode :
1452635
Title :
Photoinactivation of the Escherichia coli by the Pulsed Dielectric Barrier Discharge Excilamp Krypton Chlorine Emitted at 222 nm
Author :
Rahmani, Bouabdellah ; Hafsa, Charaoui ; Rahmani, El Roumaissàa ; Kacem, Mourad ; Harche, Meriem Kaid ; Bhosle, Sounil ; Aubes, Michel ; Zissis, Georges
Author_Institution :
Electron. Dept., Univ. of Sci. & Technol., Oran, Algeria
Volume :
38
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
953
Lastpage :
956
Abstract :
The photoinactivation of the Escherichia coli bacteria with the pulsed dielectric barrier discharge excilamp krypton chorine (KrCl) emitted at 222 nm is presented. The Escherichia coli, with the initial density of 34.106 colony forming units (CFU)/??L, has been irradiated in the aqueous and on the surface medias, respectively. A high reduction rate in the survival density of E. coli has been reached by the photoinactivation in both media during the first 30 s. The photoinactivation resulted in the logarithmic reduction factor of 5.6 log and 5.1 log within irradiation time of 30 s on the surface and in the aqueous medias, respectively. At the high dose of 2880 mJ/cm2 , the logarithmic reduction factor reached 6.1 log and 5.5 log on the surface and in the aqueous medias, respectively. The first tailing plateau was appeared on the surface and in the aqueous medias at 60 and 300 s of irradiation time, respectively.
Keywords :
bio-optics; discharges (electric); microorganisms; surface treatment; ultraviolet radiation effects; Escherichia coli bacteria; colony forming units; irradiation time; logarithmic reduction factor; photoinactivation; pulsed dielectric barrier discharge excilamp krypton chlorine; reduction rate; surface medias; survival density; tailing plateau; time 300 s; time 60 s; wavelength 222 nm; Escherichia coli; Chlorine; UV irradiance; dielectric barrier discharge (DBD); excilamp; krypton; photoinactivation; pulsed power;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2010.2041471
Filename :
5438768
Link To Document :
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