Title :
A Novel High-Temperature Planar Package for SiC Multichip Phase-Leg Power Module
Author :
Puqi Ning ; Lei, T.G. ; Fei Wang ; Guo-Quan Lu ; Ngo, Khai D. T. ; Rajashekara, K.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
This paper presents the design, development, and testing of a phase-leg power module packaged by a novel planar packaging technique for high-temperature (250°C) operation. The nanosilver paste is chosen as the die-attach material as well as playing the key functions of electrically connecting the devices´ pads. The electrical characteristics of the SiC-based power semiconductors, SiC JFETs, and SiC Schottky diodes have been measured and compared before and after packaging. No significant changes (<;5%) are found in the characteristics of all the devices. Prototype module is fabricated and operated up to 400 V, 1.4 kW at junction temperature of 250°C in the continuous power test. Thermomechanical robustness has also been investigated by passive thermal cycling of the module from -55°C to 250°C. Electrical and mechanical performances of the packaged module are characterized and considered to be reliable for at least 200 cycles.
Keywords :
Schottky diodes; junction gate field effect transistors; multichip modules; power semiconductor devices; silicon compounds; thermal management (packaging); JFET; SiC; SiC Schottky diode; SiC multichip phase-leg power module; SiC-based power semiconductor; die-attach material; high-temperature planar package; nanosilver paste; passive thermal cycling; power 1.4 kW; temperature -55 C to 250 C; thermomechanical robustness; Electric variables; JFETs; Joining processes; Multichip modules; Nanoscale devices; Phase change materials; Semiconductor device packaging; Semiconductor materials; Silicon carbide; Testing; High-temperature packaging; SiC devices;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2010.2046498