Title :
TriPleX-Based Integrated Optical Ring Resonators for Lab-on-a-Chip and Environmental Detection
Author :
Heideman, René ; Hoekman, Marcel ; Schreuder, Erik
Author_Institution :
LioniX B.V., Enschede, Netherlands
Abstract :
In this paper, we report experimental results of integrated optics ring resonators (RRs) based on TriPleX waveguide technology. The RRs operate in the near infrared enabling the use of very cost effective VCSELs as a light source. The experimentally obtained response of the ring resontors is in good agreement with theory, while the measured through and drop responses show very low on-chip losses. The chips show good coupling efficiencies to external fibers due to integrated spotsize convertors. The corresponding signal-to-noise ratio enables for measurements of changes in refractive index (RI) smaller than 1 × 10-6 RIU. The RRs are combined with an 850-nm vertical-cavity surface-emitting laser (VCSEL) as a light source and prototype electronic equipment for signal processing. Several applications are described here, such as RI measurements in fluidic channels, label-free biochemical surface reactions, and gas detection in ambient atmosphere.
Keywords :
integrated optics; lab-on-a-chip; laser cavity resonators; light sources; optical waveguides; refractive index; surface emitting lasers; TriPleX waveguide technology; TriPleX-based integrated optical ring tesonators; VCSEL; ambient atmosphere; environmental detection; external fibers; fluidic channels; gas detection; integrated optics ring resonators; integrated spotsize convertors; lab-on-a-chip; label-free biochemical surface reactions; light source; near infrared; prototype electronic equipment; refractive index; signal processing; vertical-cavity surface-emitting laser; wavelength 850 nm; Optical refraction; Optical ring resonators; Optical sensors; Optical surface waves; Optical variables control; Optical waveguides; (micro)ring resonators; Lab-on-a-chip; TriPleX technology; sensors;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2012.2188382