DocumentCode :
1453118
Title :
Relation between electroluminescence and degradation in XLPE
Author :
Zong-Huai, Fan ; Takahashi, T. ; Suzuki, J. ; Miyata, H. ; Iemura, S. ; Itoh, Takayuki ; Nakiri, T. ; Shimizu, N.
Author_Institution :
Fujikura Ltd., Tokyo, Japan
Volume :
8
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
91
Lastpage :
96
Abstract :
In order to clarify the relationship between electroluminescence (EL) and degradation in crosslinked polyethylene (XLPE), the EL measurement was carried out using three kinds of samples, block samples with two different electrode systems, and film samples. The spectral measurements revealed that the UV component of EL is below the detectable level of ~0.1 c/s (count per second), in contrast to partial discharge (PD) light from microvoids or the tiny electrical tree which includes a UV component of ≳2 c/s. Secondly, aging tests using XLPE block samples with needle-plane electrodes revealed that electrical degradation can take place even when the applied voltage is below the EL detection voltage. The above experimental results suggest that EL is not the origin of electrical degradation, i.e. photodegradation by the UV component of EL is not the dominant mechanism of electrical degradation
Keywords :
XLPE insulation; ageing; electroluminescence; insulation testing; partial discharges; trees (electrical); UV component; XLPE; aging tests; block samples; electrical degradation; electroluminescence; film samples; high sensitivity measurements; microvoids; needle-plane electrodes; partial discharge light; tiny electrical tree; Aging; Degradation; Electric variables measurement; Electrodes; Electroluminescence; Partial discharge measurement; Partial discharges; Plastic films; Polyethylene; Voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.910430
Filename :
910430
Link To Document :
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