• DocumentCode
    1453147
  • Title

    Analysis of coplanar-waveguide discontinuities with finite-metallization thickness and nonrectangular edge profile

  • Author

    Lin, Fang-Lih ; Wu, Ruey-Beei

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    45
  • Issue
    12
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    2131
  • Lastpage
    2138
  • Abstract
    In this paper, the hybrid finite-element method (FEM) is proposed to analyze the coplanar-waveguide (CPW) discontinuities with finite-metallization thickness. A variational formula for the electric field in the slot region between upper and lower half-space is derived by applying the variational-reaction theory and solved by the FEM. In the limiting case of zero metallization thickness, this finite-element analysis is reduced to a moment-method analysis using Galerkin´s approach with rooftop basis functions. The edge profile effects of a trapezoidal slot cross resulting from the etching or sputtering process can also be easily considered by this approach. Some numerical results are presented for short- and open-ended CPW discontinuities for different conductor thicknesses. It has been shown that not only the metallization thickness, but also the conductor-edge profile, can produce noticeable effects on circuit performance and should be taken into account for accurately modeling the CPW discontinuities
  • Keywords
    Galerkin method; coplanar waveguides; finite element analysis; metallisation; method of moments; slot lines; variational techniques; waveguide discontinuities; waveguide theory; Galerkin model; conductor; coplanar-waveguide discontinuities; electric field; etching; finite-metallization thickness; hybrid finite-element method; moment-method analysis; nonrectangular edge profile; rooftop basis functions; sputtering; trapezoidal slot cross; variational-reaction theory; Circuit optimization; Coplanar waveguides; Finite element methods; Integral equations; MMICs; Magnetic analysis; Magnetic resonance; Metallization; Transmission line discontinuities; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.643749
  • Filename
    643749