DocumentCode :
1453200
Title :
High-level power modeling, estimation, and optimization
Author :
Macii, Enrico ; Pedram, Massoud ; Somenzi, Fabio
Author_Institution :
Politecnico di Torino, Italy
Volume :
17
Issue :
11
fYear :
1998
fDate :
11/1/1998 12:00:00 AM
Firstpage :
1061
Lastpage :
1079
Abstract :
Silicon area, performance, and testability have been, so far, the major design constraints to be met during the development of digital very-large-scale-integration (VLSI) systems. In recent years, however, things have changed; increasingly, power has been given weight comparable to the other design parameters. This is primarily due to the remarkable success of personal computing devices and wireless communication systems, which demand high-speed computations with low power consumption. In addition, there exists a strong pressure for manufacturers of high-end products to keep power under control, due to the increased costs of packaging and cooling this type of device. Last, the need of ensuring high circuit reliability has turned out to be more stringent. The availability of tools for the automatic design of low-power VLSI systems has thus become necessary. More specifically, following a natural trend, the interests of the researchers have lately shifted to the investigation of power modeling, estimation, synthesis, and optimization techniques that account for power dissipation during the early stages of the design flow. This paper surveys representative contributions to this area that have appeared in the recent literature
Keywords :
VLSI; circuit optimisation; design for testability; high level synthesis; integrated circuit design; integrated circuit modelling; integrated circuit reliability; low-power electronics; VLSI; automatic design; circuit optimization; circuit reliability; cooling; design constraints; design flow; design parameters; estimation; high-end products; high-level power modeling; high-speed computations; low-power VLSI systems; power consumption; power dissipation; power modeling; testability; wireless communication systems; Automatic control; Energy consumption; Manufacturing; Power system modeling; Pressure control; Silicon; System testing; Temperature control; Very large scale integration; Wireless communication;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.736181
Filename :
736181
Link To Document :
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