Title :
Upgrading Design to a 25 T Cryogen-Free Superconducting Magnet Based on Low Temperature and High Magnetic Field Properties of the Practical CVD Processed Coated Conductors
Author :
Awaji, Satoshi ; Ishihara, Ryosuke ; Namba, Masafumi ; Nishijima, Gen ; Oguro, Hidetoshi ; Watanabe, Kazuo ; Shikimachi, Koji ; Hirano, Naoki ; Nagaya, Shigeo
Author_Institution :
High Field Lab. for Supercond. Mater., Toshoku Univ., Sendai, Japan
fDate :
6/1/2010 12:00:00 AM
Abstract :
We evaluated critical current density and mechanical properties of the Y123 coated conductor (CC) tapes on buffered Hastelloy substrates prepared by the chemical vapor deposition method in high magnetic fields and low temperatures. The Jc values of the tape are about 1.1 MA/cm at 77.3 K, 0 T and 1.8 MA/cm2 at 4.2 K and 17 T for B//c. In addition, the hoop stress test of the single layer coil shows that the stress limit of the CVD-Y123 CC tapes on Hastelloy is over 1 GPa. On the basis of those experimental data, we designed the innermost high temperature superconducting insert coil for upgrading of the 18 T cryogen-free superconducting magnet (18 T-CSM) under the condition of the stress limit of 600 MPa. The coil, which consists of the 22 double pancake coils can generate 9.4 T with the operation current of 295 A in the backup field of 15.6 T. In this case, the central field of the 18 T-CSM can be improved up to 25 T from 18.1 T.
Keywords :
chemical vapour deposition; coatings; critical current density (superconductivity); cryogenics; high-temperature superconductors; iron alloys; molybdenum alloys; nickel alloys; superconducting coils; superconducting magnets; Y123 coated conductor tapes; buffered Hastelloy substrates; critical current density; cryogen-free superconducting magnet; high temperature superconducting insert coil; hoop stress test; operation current; practical CVD processed coated conductors; temperature 4.2 K; temperature 77.3 K; Coated conductor; critical current; cryogen-free superconducting magnet; high field;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2041755