• DocumentCode
    1453464
  • Title

    Studies on the classical gain approximations and the aperture-reflection coefficient of rectangular waveguide antennas

  • Author

    Selvan, Krishnasamy T.

  • Author_Institution
    Sameer-Centre for Electromagnetics, Madras, India
  • Volume
    40
  • Issue
    4
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    343
  • Lastpage
    347
  • Abstract
    The classical approximations for the gain of rectangular waveguide antennas are examined in the light of a previously proposed approximation for the fringe currents at the shorter edges of the waveguide. By using the alternative fringe-current representation, expressions are subsequently presented for estimating the magnitude of the TE10 mode reflection coefficient at the aperture of standard open-ended rectangular waveguides (OEG). The derivation, accomplished by equating total input power to radiated power, assumes negligible resistive loss in the waveguide walls. The reflection coefficient values predicted by the expressions compare favorably with available measured data and with a different analytical technique. A significant application of these expressions would be in predicting the on-axis gain and far-field of the OEG by using Yaghjian´s (1984) formulas
  • Keywords
    antenna radiation patterns; approximation theory; electric current; electromagnetic wave reflection; rectangular waveguides; waveguide antennas; TE10 mode reflection coefficient; aperture-reflection coefficient; classical gain approximations; far-field; fringe currents approximation; input power; measured data; on-axis gain; open-ended rectangular waveguides; radiated power; rectangular waveguide antennas; resistive loss; waveguide walls; Aperture antennas; Bandwidth; Collaborative work; Electromagnetic fields; Electromagnetic waveguides; NIST; Optical reflection; Rectangular waveguides; Reflector antennas; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.736220
  • Filename
    736220