DocumentCode :
1453577
Title :
NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors
Author :
Miwa, Tohru ; Yamada, Junichi ; Koike, Hiroki ; Toyoshima, Hideo ; Amanuma, Kazushi ; Kobayashi, Sota ; Tatsumi, Toru ; Maejima, Yukihiko ; Hada, Hiromitsu ; Kunio, Takemitsu
Author_Institution :
Syst. Devices & Fundamental Res., NEC Corp., Kanagawa, Japan
Volume :
36
Issue :
3
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
522
Lastpage :
527
Abstract :
This paper demonstrates new circuit technologies that enable a 0.25-μm ASIC SRAM macro to be nonvolatile with only a 17% cell-area overhead. New capacitor-on-metal/via-stacked-plug process technologies permit a nonvolatile SRAM (NV-SRAM) cell to consist of a six-transistor ASIC SRAM cell and two backup ferroelectric capacitors stacked over the SRAM portion. READ and WRITE operations in this NV-SRAM cell are very similar to those of a standard SRAM, and this NV-SRAM shares almost all the circuit properties of a standard SRAM. Because each memory cell can perform STORE and RECALL individually, both can execute massive-parallel operations. A Vdd/2 plate-line architecture makes READ/WRITE fatigue negligible. A 512-byte test chip was successfully fabricated to show compatibility with ASIC technologies
Keywords :
SRAM chips; application specific integrated circuits; cellular arrays; ferroelectric capacitors; ferroelectric storage; parallel memories; 0.25 micron; ASIC; NV-SRAM; backup ferroelectric capacitors; capacitor-on-metal/via-stacked-plug process technologies; cell-area overhead; circuit properties; massive-parallel operations; nonvolatile SRAM; plate-line architecture; Application specific integrated circuits; Capacitors; EPROM; Fatigue; Ferroelectric films; Ferroelectric materials; Flash memory; Nonvolatile memory; Random access memory; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.910492
Filename :
910492
Link To Document :
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