DocumentCode :
1453650
Title :
Semisupervised Learning Using Bayesian Interpretation: Application to LS-SVM
Author :
Adankon, Mathias M. ; Cheriet, Mohamed ; Biem, Alain
Author_Institution :
Synchromedia Lab. for Multimedia Commun. in Telepresence, Univ. of Quebec, Montreal, QC, Canada
Volume :
22
Issue :
4
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
513
Lastpage :
524
Abstract :
Bayesian reasoning provides an ideal basis for representing and manipulating uncertain knowledge, with the result that many interesting algorithms in machine learning are based on Bayesian inference. In this paper, we use the Bayesian approach with one and two levels of inference to model the semisupervised learning problem and give its application to the successful kernel classifier support vector machine (SVM) and its variant least-squares SVM (LS-SVM). Taking advantage of Bayesian interpretation of LS-SVM, we develop a semisupervised learning algorithm for Bayesian LS-SVM using our approach based on two levels of inference. Experimental results on both artificial and real pattern recognition problems show the utility of our method.
Keywords :
inference mechanisms; knowledge representation; learning (artificial intelligence); least squares approximations; pattern classification; Bayesian LS-SVM; Bayesian inference; Bayesian interpretation; Bayesian reasoning; kernel classifier support vector machine; least-squares SVM; machine learning; pattern recognition problems; semisupervised learning problem; uncertain knowledge manipulation; uncertain knowledge representation; Bayesian methods; Data models; Kernel; Optimization; Semisupervised learning; Support vector machines; Training; Bayesian inference; SVM; kernel machine; least-square support vector machine (SVM); semisupervised learning; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Humans; Least-Squares Analysis; Normal Distribution; Pattern Recognition, Automated;
fLanguage :
English
Journal_Title :
Neural Networks, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9227
Type :
jour
DOI :
10.1109/TNN.2011.2105888
Filename :
5715887
Link To Document :
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