Title :
Current-Based Testing of Optical Feedback Pixel Driver
Author :
Papadopoulos, Nikolas P. ; Papakostas, Dimitris K. ; Hatzopoulos, Alkis A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
fDate :
4/1/2010 12:00:00 AM
Abstract :
A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE.
Keywords :
circuit testing; driver circuits; optical feedback; organic light emitting diodes; pulse width modulation; thin film transistors; HSPICE; OLED; current-based testing; instrumentation IC; measuring system; optical feedback pixel driver; organic light emitting diode; pulse width modulation; thin-film transistor; Circuit simulation; Circuit testing; Current measurement; Driver circuits; Optical feedback; Optical pulses; Organic light emitting diodes; Pulse circuits; Pulse width modulation; Space vector pulse width modulation; Optical feedback pixel driver (OFPD); poly-Si thin-film transistor (TFT); testing;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2009.2039986
