Current-Based Testing of Optical Feedback Pixel Driver

Author

Papadopoulos, Nikolas P. ; Papakostas, Dimitris K. ; Hatzopoulos, Alkis A.

Author_Institution

Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece

Volume

6

Issue

4

fYear

2010

fDate

4/1/2010 12:00:00 AM

Firstpage

150

Lastpage

157

Abstract

A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I _pixel current (which is proportional to I _oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I _pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE.

Keywords

circuit testing; driver circuits; optical feedback; organic light emitting diodes; pulse width modulation; thin film transistors; HSPICE; OLED; current-based testing; instrumentation IC; measuring system; optical feedback pixel driver; organic light emitting diode; pulse width modulation; thin-film transistor; Circuit simulation; Circuit testing; Current measurement; Driver circuits; Optical feedback; Optical pulses; Organic light emitting diodes; Pulse circuits; Pulse width modulation; Space vector pulse width modulation; Optical feedback pixel driver (OFPD); poly-Si thin-film transistor (TFT); testing;

fLanguage

English

Journal_Title

Display Technology, Journal of

Publisher

ieee

ISSN

1551-319X

Type

jour

DOI

10.1109/JDT.2009.2039986

Filename

5438918