Title :
Novel High Robustness RF ESD Protection Circuits Applied to 5.8-GHz GaAs-Based HBT Amplifiers
Author :
Huang, Bo-Jr ; Lin, Kun-You ; Chiong, Chau-Ching ; Wang, Huei
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
3/1/2011 12:00:00 AM
Abstract :
In this paper, the design and analysis of two novel high robustness RF electrostatic discharge (ESD) protection are proposed in GaAs 2-μm HBT process. One incorporates with the ESD devices to form a bandpass filter structure with good impedance matching, which has eight discharging paths. The other is fabricated with parasitic capacitance reduction technique for the ESD protection, and has four discharging paths. These two protection circuits are also applied to 5.8-GHz amplifiers for demonstration. In the meanwhile, two amplifiers without ESD protection and with conventional ESD protection are fabricated in parallel for comparison. Based on the measurement results, it indicates that the two proposed ESD-protected amplifiers feature much higher ESD robustness and better RF performance than the conventional design.
Keywords :
band-pass filters; electrostatic discharge; gallium arsenide; heterojunction bipolar transistors; impedance matching; microwave amplifiers; microwave filters; ESD devices; GaAs; HBT amplifiers; bandpass filter structure; electrostatic discharge; frequency 5.8 GHz; high robustness RF ESD protection circuits; impedance matching; parasitic capacitance reduction technique; size 2 mum; Electrostatic discharge; Inductors; Junctions; Parasitic capacitance; Performance evaluation; Radio frequency; Robustness; Amplifier; GaAs; HBT; electrostatic discharge (ESD) protection;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2011.2104790