DocumentCode :
1454498
Title :
1800 V NPN bipolar junction transistors in 4H-SiC
Author :
Ryu, Sei-Hyung ; Agarwal, Anant K. ; Singh, Ranbir ; Palmour, JohnW
Author_Institution :
Cree Inc., Durham, NC, USA
Volume :
22
Issue :
3
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
124
Lastpage :
126
Abstract :
The first high voltage npn bipolar junction transistors (BJTs) in 4H-SiC have been demonstrated. The BJTs were able to block 1800 V in common emitter mode and showed a peak current gain of 20 and an on-resistance of 10.8 m/spl Omega//spl middot/cm/sup 2/ at room temperature (I/sub C/=2.7 A @ V/sub CE/=2 V for a 1 mm/spl times/1.4 mm active area), which outperforms all SiC power switching devices reported to date. Temperature-stable current gain was observed for these devices. This is due to the higher percent ionization of the deep level acceptor atoms in the base region at elevated temperatures, which offsets the effects of increased minority carrier lifetime at high temperatures. These transistors show a positive temperature coefficient in the on-resistance characteristics, which will enable easy paralleling of the devices.
Keywords :
carrier lifetime; deep levels; minority carriers; power bipolar transistors; silicon compounds; wide band gap semiconductors; 1800 V; 4H-SiC high-voltage n-p-n bipolar junction transistor; SiC; blocking voltage; current gain; deep level acceptor; minority carrier lifetime; on-resistance; power switching device; temperature coefficient; Charge carrier lifetime; Etching; Fingers; Ion implantation; Ionization; MOSFETs; Silicon carbide; Temperature; Thermal conductivity; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.910617
Filename :
910617
Link To Document :
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